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ADM1087AKSZ-REEL7

ADM1087AKSZ-REEL7

ADM1087AKSZ-REEL7

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Part Number ADM1087AKSZ-REEL7
Manufacturer Analog Devices Inc.
Description IC SIMPLE SEQUENCER OD SC70-6
Datasheet ADM1087AKSZ-REEL7 Datasheet
Package 6-TSSOP, SC-88, SOT-363
In Stock 4,903 piece(s)
Unit Price $ 0.4808 *
Lead Time To be Confirmed
Estimated Delivery Time Aug 10 - Aug 15 (Choose Expedited Shipping)
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Part Number # ADM1087AKSZ-REEL7 (PMIC - Supervisors) is manufactured by Analog Devices Inc. and distributed by Heisener. Being one of the leading electronics distributors, we carry many kinds of electronic components from some of the world’s top class manufacturers. Their quality is guaranteed by its stringent quality control to meet all required standards.

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ADM1087AKSZ-REEL7 Specifications

ManufacturerAnalog Devices Inc.
CategoryIntegrated Circuits (ICs) - PMIC - Supervisors
Datasheet ADM1087AKSZ-REEL7Datasheet
Package6-TSSOP, SC-88, SOT-363
SeriesSimple Sequencers?
TypeSequencer
Number of Voltages Monitored1
OutputOpen Drain or Open Collector
ResetActive Low
Reset TimeoutAdjustable/Selectable
Voltage - ThresholdAdjustable/Selectable
Operating Temperature-40°C ~ 125°C (TA)
Mounting TypeSurface Mount
Package / Case6-TSSOP, SC-88, SOT-363
Supplier Device PackageSC-70-6

ADM1087AKSZ-REEL7 Datasheet

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Simple Sequencers® in 6-Lead SC70 Data Sheet ADM1085/ADM1086/ADM1087 Rev. B Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2004–2014 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com FEATURES Provide programmable time delays between enable signals Can be cascaded with power modules for multiple supply sequencing Power supply monitoring from 0.6 V Output stages High voltage (up to 22 V) open-drain output (ADM1085/ADM1087) Push-pull output (ADM1086) Capacitor-adjustable time delays High voltage (up to 22 V) enable and VIN inputs Low power consumption (15 μA) Specified over –40°C to +125°C temperature range 6-lead SC70 package APPLICATIONS Desktop/notebook computers, servers Low power portable equipment Routers Base stations Line cards Graphics cards FUNCTIONAL BLOCK DIAGRAMS CAPACITOR ADJUSTABLE DELAY0.6V ADM1085/ADM1086 VIN ENOUT ENINCEXT VCC GND CAPACITOR ADJUSTABLE DELAY0.6V ADM1087 VIN ENOUT ENINCEXT VCC GND 04 59 1- 00 1 Figure 1. GENERAL DESCRIPTION The ADM1085/ADM1086/ADM1087 are simple sequencing circuits that provide a time delay between the enabling of voltage regulators and/or dc-dc converters at power-up in multiple supply systems. When the output voltage of the first power module reaches a preset threshold, a time delay is initiated before an enable signal allows subsequent regulators to power up. Any number of these devices can be cascaded with regulators to allow sequencing of multiple power supplies. Threshold levels can be set with a pair of external resistors in a voltage divider configuration. With appropriate resistor values, the threshold can be adjusted to monitor voltages as low as 0.6 V. The ADM1086 has a push-pull output stage, with active high (ENOUT). The ADM1085 has an active-high (ENOUT) logic output; the ADM1087 has an active-low (ENOUT) output. Both the ADM1085 and ADM1087 have open-drain output stages that can be pulled up to voltage levels as high as 22 V through an external resistor. This level-shifting property ensures compatibility with enable input logic levels of different regulators and converters. All four models have a dedicated enable input pin that allows the output signal to the regulator to be controlled externally. This is an active high input (ENIN) for the ADM1085 and ADM1086, and an active low input (ENIN) for the ADM1087. The Simple Sequencers are specified over the extended −40°C to +125°C temperature range. With low current consumption of 15 μA (typical) and 6-lead SC70 packaging, the parts are suitable for low-power portable applications. Table 1. Selection Table Output Stage Part No. Enable Input ENOUT ENOUT ADM1085 ENIN Open-drain ADM1086 ENIN Push-pull ADM1087 ENIN Open-drain

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ADM1085/ADM1086/ADM1087 Data Sheet Rev. B | Page 2 of 16 TABLE OF CONTENTS Features .............................................................................................. 1  Applications ....................................................................................... 1  Functional Block Diagrams ............................................................. 1  General Description ......................................................................... 1  Revision History ............................................................................... 2  Specifications ..................................................................................... 3  Absolute Maximum Ratings ............................................................ 4  ESD Caution .................................................................................. 4  Pin Configuration and Function Descriptions ............................. 5  Typical Performance Characteristics ............................................. 6  Circuit Information .......................................................................... 9  Timing Characteristics and Truth Tables .................................. 9  Capacitor-Adjustable Delay Circuit ............................................9  Open-Drain and Push-Pull Outputs ....................................... 10  Application Information ................................................................ 11  Sequencing Circuits ................................................................... 11  Dual LOFO Sequencing ............................................................ 13  Simultaneous Enabling .............................................................. 13  Power Good Signal Delays ........................................................ 13  Quad-Supply Power Good Indicator ....................................... 14  Sequencing with FET Switches ................................................. 14  Outline Dimensions ....................................................................... 15  Ordering Guide .......................................................................... 15  REVISION HISTORY 5/14—Rev. A to Rev. B Removed ADM1088 ...................................................... Throughout Changes to Capacitor-Adjustable Delay Circuit........................... 9 Removed Figure 26; Renumbered Sequentially.......................... 12 Changes to Ordering Guide .......................................................... 15 4/06—Rev. 0 to Rev. A Added Lead-Free Models .................................................. Universal Update Outline Dimensions ......................................................... 15 Changes to Ordering Guide .......................................................... 15 7/04—Revision 0: Initial Version

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Data Sheet ADM1085/ADM1086/ADM1087 Rev. B | Page 3 of 16 SPECIFICATIONS VCC = full operating range, TA = −40°C to +125°C, unless otherwise noted. Table 2. Parameter Min Typ Max Unit Test Conditions/Comments SUPPLY VCC Operating Voltage Range 2.25 3.6 V VIN Operating Voltage Range 0 22 V Supply Current 10 15 μA VIN Rising Threshold, VTH_RISING 0.56 0.6 0.64 V VCC = 3.3 V VIN Falling Threshold, VTH_FALLING 0.545 0.585 0.625 V VCC = 3.3 V VIN Hysteresis 15 mV VIN to ENOUT/ENOUT Delay VIN Rising 35 μs CEXT floating, C = 20 pF 2 ms CEXT = 470 pF VIN Falling 20 μs VIN = VTH_FALLING to (VTH_FALLING − 100 mV) VIN Leakage Current 170 μA VIN = 22 V CEXT Charge Current 125 250 375 nA Threshold Temperature Coefficient 30 ppm/°C ENIN/ENIN to ENOUT/ENOUT Propagation Delay 0.5 μs VIN > VTH_RISING ENIN/ENIN Voltage Low 0.3 VCC − 0.2 V ENIN/ENIN Voltage High 0.3 VCC + 0.2 V ENIN/ENIN Leakage Current 170 μA ENIN/ENIN = 22 V ENOUT/ENOUT Voltage Low 0.4 V VIN < VTH_FALLING (ENOUT), VIN > VTH_RISING (ENOUT), ISINK = 1.2 mA ENOUT/ENOUT Voltage High (ADM1086) 0.8 VCC V VIN > VTH_RISING (ENOUT), VIN < VTH_FALLING (ENOUT), ISOURCE = 500 μA ENOUT/ENOUT Open-Drain Output Leakage Current (ADM1085/ADM1087) 0.4 μA ENOUT/ENOUT = 22 V

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ADM1085/ADM1086/ADM1087 Data Sheet Rev. B | Page 4 of 16 ABSOLUTE MAXIMUM RATINGS TA = 25°C, unless otherwise noted. Table 3. Parameter Rating VCC −0.3 V to +6 V VIN −0.3 V to +25 V CEXT −0.3 V to +6 V ENIN, ENIN −0.3 V to +25 V ENOUT, ENOUT (ADM1085, ADM1087) −0.3 V to +25 V ENOUT, ENOUT (ADM1086) −0.3 V to +6 V Operating Temperature Range −40°C to +125°C Storage Temperature Range −65°C to +150°C θJA Thermal Impedance, SC70 146°C/W Lead Temperature Soldering (10 sec) 300°C Vapor Phase (60 sec) 215°C Infrared (15 sec) 220°C Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION

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Data Sheet ADM1085/ADM1086/ADM1087 Rev. B | Page 5 of 16 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS ENIN/ENIN 1 GND 2 VIN 3 VCC6 CEXT5 ENOUT/ENOUT4 ADM1085/ ADM1086/ ADM1087 TOP VIEW (Not to Scale) 04 59 1- 00 2 Figure 2. Pin Configuration Table 4. Pin Function Descriptions Pin No. Mnemonic Description 1 ENIN, ENIN Enable Input. Controls the status of the enable output. Active high for ADM1085/ADM1086. Active low for ADM1087. 2 GND Ground. 3 VIN Input for the Monitored Voltage Signal. Can be biased via a voltage divider resistor network to customize the effective input threshold. Can precisely monitor an analog power supply output signal and detect when it has powered up. The voltage applied at this pin is compared with a 0.6 V on-chip reference. With this reference, digital signals with various logic level thresholds can also be detected. 4 ENOUT, ENOUT Enable Output. Asserted when the voltage at VIN is above VTH_RISING and the time delay has elapsed, provided that the enable input is asserted. Active high for the ADM1085/ADM1086. Active low for the ADM1087. 5 CEXT External Capacitor Pin. The capacitance on this pin determines the time delay on the enable output. The delay is seen only when the voltage at VIN rises past VTH_RISING, and not when it falls below VTH_FALLING. 6 VCC Power Supply.

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ADM1085/ADM1086/ADM1087 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 700 500 520 540 560 580 600 620 640 660 680 –40 –25 –10 5 20 35 50 65 80 95 110 125 TEMPERATURE (°C) V T R IP (m V) VTRIP RISING VTRIP FALLING 04 59 1- 00 3 Figure 3. VIN Threshold vs. Temperature 12.0 8.0 8.5 9.0 9.5 10.0 10.5 11.0 11.5 2.1 2.4 2.7 3.0 3.3 3.6 VCC (V) I C C (µ A ) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 00 4 Figure 4. Supply Current vs. Supply Voltage 20 18 16 14 12 10 8 6 4 2 0 0 2 4 6 8 10 12 14 16 18 20 22 VIN (V) SU PP LY C U R R EN T (µ A ) 04 59 1- 00 5 Figure 5. Supply Current vs. VIN Voltage 200 180 160 140 120 100 80 60 40 20 0 0 2 4 6 8 10 12 14 16 18 20 22 VIN (V) V I N L EA K A G E C U R R EN T (µ A ) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 00 6 Figure 6. VIN Leakage Current vs. VIN Voltage 200 190 180 170 160 150 140 130 120 110 100 2.1 3.63.33.02.72.4 VCC (V) V I N L EA K A G E C U R R EN T (µ A ) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 00 7 Figure 7. VIN Leakage Current vs. VCC Voltage 10000 1 10 100 1000 0.1 0.01 100201010.1 OUTPUT SINK CURRENT (mA) O U TP U T VO LT A G E (m V) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 00 8 Figure 8. Output Voltage vs. Output Sink Current Rev. B | Page 6 of 16

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Data Sheet ADM1085/ADM1086/ADM1087 120 100 80 60 40 20 0 2.1 2.4 2.7 3.0 3.3 3.6 SUPPLY VOLTAGE (V) O U TP U T LO W V O LT A G E (m V) 04 59 1- 00 9 Figure 9. Output Low Voltage vs. Supply Voltage 100 0 10 20 30 40 50 60 70 80 90 –40 –25 –10 5 20 35 50 65 80 95 110 125 TEMPERATURE (°C) PR O PA G A TI O N D EL A Y (µ s) 1mV/µs 10mV/µs 04 59 1- 01 0 Figure 10. VCC Falling Propagation Delay vs. Temperature 500 450 400 350 300 250 200 150 100 50 0 2.1 2.4 2.7 3.0 3.3 3.6 SUPPLY VOLTAGE (V) FA LL T IM E (n s) 04 59 1- 01 1 Figure 11. Output Fall Time vs. Supply Voltage 200 180 160 140 120 100 80 60 40 20 0 0 2 4 6 8 10 12 14 16 18 20 22 ENIN/ENIN (V) EN IN /E N IN L EA K A G E (µ A ) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 01 2 Figure 12. ENIN/ENIN Leakage Current vs. ENIN/ENIN Voltage 200 180 160 140 120 100 80 60 40 20 0 2.1 3.63.33.02.72.4 VCC (V) EN IN L EA K A G E (µ A ) TA = +125°C TA = +25°C TA = –40°C 04 59 1- 01 3 Figure 13. ENIN/ENIN Leakage Current vs. VCC Voltage 10000 1000 100 10 1 0.1 0.562 262004480235052024153.222.95.022.390 TIMEOUT DELAY (ms) C EX T (n F) 04 59 1- 01 4 Figure 14. CEXT Capacitance vs. Timeout Delay Rev. B | Page 7 of 16

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ADM1085/ADM1086/ADM1087 Data Sheet 300 100 120 140 160 180 200 220 240 260 280 –40 –25 –10 5 20 35 50 65 80 95 110 125 TEMPERATURE (°C) C H A R G E C U R R EN T (n A ) 04 59 1- 01 5 Figure 15. CEXT Charge Current vs. Temperature 100 0 10 20 30 40 50 60 70 80 90 –40 –25 –10 5 20 35 50 65 80 95 110 125 TEMPERATURE (°C) PR O PA G A TI O N D EL A Y (µ s) 04 59 1- 01 6 Figure 16. VIN to ENOUT/ENOUT Propagation Delay (CEXT Floating) vs. Temperature 100 0 10 20 30 40 50 60 70 80 90 1 10 100 1000 COMPARATOR OVERDRIVE (mV) TR A N SI EN T D U R A TI O N (µ s) 04 59 1- 01 7 Figure 17. Maximum VIN Transient Duration vs. Comparator Overdrive Rev. B | Page 8 of 16

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Data Sheet ADM1085/ADM1086/ADM1087 Rev. B | Page 9 of 16 CIRCUIT INFORMATION TIMING CHARACTERISTICS AND TRUTH TABLES The enable outputs of the ADM1085/ADM1086/ADM1087 are related to the VIN and enable inputs by a simple AND function. The enable output is asserted only if the enable input is asserted and the voltage at VIN is above VTH_RISING, with the time delay elapsed. Table 5 and Table 6 show the enable output logic states for different VIN/enable input combinations when the capacitor delay has elapsed. The timing diagrams in Figure 18 and Figure 19 give a graphical representation of how the ADM1085/ADM1086/ ADM1087 enable outputs respond to VIN and enable input signals. Table 5. ADM1085/ADM1086 Truth Table VIN ENIN ENOUT VTH_RISING 0 0 >VTH_RISING 1 1 Table 6. ADM1087 Truth Table VIN ENIN ENOUT VTH_RISING 1 1 >VTH_RISING 0 0 VIN ENIN ENOUT tEN VTH_RISING VTH_FALLING 04 59 1- 02 3 Figure 18. ADM1085/ADM1086 Timing Diagram VIN ENIN ENOUT tEN VTH_RISING VTH_FALLING 04 59 1- 02 4 Figure 19. ADM1087 Timing Diagram When VIN reaches the upper threshold voltage (VTH_RISING), an internal circuit generates a delay (tEN) before the enable output is asserted. If VIN drops below the lower threshold voltage (VTH_FALLING), the enable output is deasserted immediately. Similarly, if the enable input is disabled while VIN is above the threshold, the enable output deasserts immediately. Unlike VIN, a low-to-high transition on ENIN (or high-to-low on ENIN) does not yield a time delay on ENOUT (ENOUT). CAPACITOR-ADJUSTABLE DELAY CIRCUIT Figure 20 shows the internal circuitry used to generate the time delay on the enable output. A 250 nA current source charges a small internal parasitic capacitance (CINT). When the capacitor voltage reaches 1.2 V, the enable output is asserted. The time taken for the capacitor to reach 1.2 V, in addition to the propa- gation delay of the comparator, constitutes the enable timeout, which is typically 35 μs. To minimize the delay between VIN falling below VTH_FALLING and the enable output deasserting, an NMOS transistor is connected in parallel with CINT. The output of the voltage detector is connected to the gate of this transistor so that, when VIN falls below VTH_FALLING, the transistor switches on and CINT discharges quickly. 1.2V C CINT CEXT SIGNAL FROM VOLTAGE DETECTOR TO AND GATEAND OUTPUT STAGE VCC 250nA 04 59 1- 02 5 Figure 20. Capacitor-Adjustable Delay Circuit Connecting an external capacitor to the CEXT pin delays the rise time—and therefore the enable timeout—further. The relationship between the value of the external capacitor and the resulting timeout is characterized by the following equation: tEN = (C × 4.8 ×106) + 35 μs where: C is expressed in farads (F), and tEN is expressed in seconds (sec).

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