Sensors for high quality and low power imaging for factory automation and ITS | Heisener Electronics
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Sensors for high quality and low power imaging for factory automation and ITS

Technology Cover
Post Date: 2022-02-27, ON Semiconductor

     ON Semiconductor has joined the XGS family of CMOS image sensors. The XGS 16000 is a 16-megapixel sensor that provides high-quality global shutter imaging for factory automation applications, including robotics and inspection systems. Consuming only 1W at 65fps, the device produces excellent performance at low power consumption. This makes it best-in-class in terms of power consumption, while also offering the highest resolution for a standard 29mm x 29mm industrial camera.

     The device has the same structure and footprint as other XGS CMOS image sensors. Supports 65fps full resolution readings, sensors are available in a variety of speed levels, and all Bayer color or monochrome options. This allows manufacturers to use a single camera design to produce products with different resolutions.

    The company's global shutter pixel technology addresses the limitations associated with rolling shutter pixels in applications. Using the global shutter method can avoid motion blur and distortion artifacts. This is often important in automation, inspection, and identification applications.

     The device uses a unique 1:1 square aspect ratio design that helps maximize the image capture area within the optical ring of the camera lens and ensures optimal light sensitivity. Because of this design, the sensor is compatible with industry standard camera formats of 29mm2 using commercially available c-interface lenses. This optimizes the available field of view and sensor area based on the physical size of the camera.

    To simplify the design of the new camera, the company offers color and SLR versions of the XGS 16000 X-Cube and X-Celerator development packages. Examples of high-speed conversions to MIPI interfaces are provided with reference design kits to provide faster integration into standard FPGA evaluation environments.

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